Third generation

            Semiconductor Testing

            family

            Third generation semiconductor testing family
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            KGD (Know Good Die) testing solution

            Supports high temperature and normal temperature testing: DC+SW+UIL+DC&RG; Support testing pin card protection scheme; Provide a complete set of testing + sorting solutions;



            Needle jam protection

            Test two together

            High temperature and normal temperature

            Data merge

            Model KGD testing solutions
            Product Advantages ? Low spurious solutions;
            ? Exclusive pin card protection patented technology;
            ? Overload and undervoltage protection;
            ? Test two wafers at a time;
            ? Supports high temperature heating






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