QT-8400 power device multi-site test system
            Explore the infinite possibilities of third-generation transistors

            test host

            GaN

            Power Device

            QT-8400 is composed of test host and test station Test Kit,
            There are two types of Test Kit: Power Device Test Kit & GaN Test Kit.

            Test Kit
            Can be selected according to needs
            • Power Device Test Kit

              Power Device Test Kit for CP testing needs such as MOSFET/SIC, diodes, transistors, etc.

            • GaN Test Kit

              GaN Test Kit for Gallium Nitride testing needs.

            105cm
            Standing keyboard height
            75cm
            Sitting keyboard height
            Sign design
            Stand & sit
            quick switch
            Heart-touching
            user experience

            Based on the ergonomic design, the 8400 main case is designed for different environments such as design companies, laboratories, and packaging and testing factories to meet the user's keyboard operation needs in different standing and sitting postures. We have designed a unique guide line. , allowing users to quickly find the recommended keyboard height when standing or sitting, and can also fine-tune it according to personal height differences, which greatly improves operating comfort and efficiency.

            * Patent applied

            Sign design
            Stand & sit
            quick switch
            Heart-touching
            User experience

            Based on the ergonomic design, the 8400 main case is designed for different environments such as design companies, laboratories, and packaging and testing factories to meet the user's keyboard operation needs in different standing and sitting postures. We have designed a unique guide line. , allowing users to quickly find the recommended keyboard height when standing or sitting, and can also fine-tune it according to personal height differences, which greatly improves operating comfort and efficiency.

            * Patent applied

            105cm
            Standing keyboard height
            75cm
            Sitting keyboard height
            Parallel testing
            doubles efficiency
            Supports 2/4/8/16 Site parallel testing to meet customer needs for higher testing efficiency.
            Testing needs,
            comprehensive coverage
            The QT-8400 complete machine provides 20A/100A, 1KV/2KV technical specifications, which can meet the testing needs of most third-generation transistors. If customers have higher specifications, we also support expansion of high-voltage/DC modules, up to 8KV, 2000A. For users with dynamic testing needs, we also provide extensions to avalanche, RGCG, dynamic RDson and other modules, and plan to be compatible with more dynamic testing modules in the future.

            QT-8400 GaN

            QT-8400 D

            測(cè)試范圍

            專用于氮化鎵動(dòng)靜態(tài)電參數(shù)測(cè)試

            測(cè)試范圍

            專用于 MOSFET/SIC 、二極管、三極管、IGBT等 CP測(cè)試。

            參數(shù)指標(biāo)

            懸浮 V/I 源
            電壓 1KV/2KV
            20-100A;

            參數(shù)指標(biāo)

            懸浮 V/I 源
            電壓1KV/2KV/3KV
            20-100A/200A

            并行測(cè)試數(shù)

            2/4/8/16 Site

            并行測(cè)試數(shù)

            2/4/8/16 Site

            可擴(kuò)展動(dòng)態(tài)模組

            LCR測(cè)試模組(CG)
            動(dòng)態(tài) RDSON 模組(支持硬切和軟切)

            可擴(kuò)展動(dòng)態(tài)模組

            雪崩測(cè)試模組(UIS、EAS)
            LCR測(cè)試模組(RG、CG)

            可擴(kuò)展高壓/直流模組

            最高可擴(kuò)展8KV, 2KA

            可擴(kuò)展高壓/直流模組

            最高可擴(kuò)展8KV, 2KA

            精準(zhǔn)測(cè)量

            Power Device Test Kit內(nèi)置精密測(cè)量電路,實(shí)現(xiàn)nA級(jí)和mΩ級(jí)的精準(zhǔn)測(cè)量。

            精準(zhǔn)測(cè)量

            GaN Test Kit內(nèi)置精密測(cè)量電路,實(shí)現(xiàn)nA級(jí)和mΩ級(jí)的精準(zhǔn)測(cè)量。

            Flexible allocation
            of board resources
            Our equipment adopts a pluggable board architecture, allowing you to flexibly match boards according to your needs, thereby achieving precise control of testing costs.
            Comprehensive functions to
            meet various needs
            The test host boards are all four-quadrant V/I sources, equipped with AWG and oscilloscope, and have comprehensive functions to meet various scanning test needs such as I-V curves.

            Built-in oscilloscope graph

            AWG Editor
            PTS OS is intuitive and easy to use,
            Designed for testing & production
            We have fully optimized the QT-8400 PTS OS software interface to improve practicality, aesthetics and ease of use. Greatly improve the efficiency of test development, production and debugging and calibration, making it easy for users to operate efficiently.

            * Patent applied

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